Automatic Wafer Probe Card Optical Inspection Equipment PCIM-3000
Shuz Tung Machinery Industrial Co., Ltd
Features
•Replace manual work and reduce human resource costs.
•Automated high-speed scanning to improve measurement accuracy and repeatability.
•High-precision 2D / 3D dimension topography measurement function.
•Statistical management of user inspection data.
•Automatic storage and reporting of inspection data.
Applications
•Probe Tip Measurement Reproducibility: ≤ 1 μm
•Guide Plate Measurement Reproducibility: ≤ 3 μm
•Screw Height Measurement Reproducibility: ≤ 5 μm
•Measurement Item: Tip Length, Tip Diameter, Tip Alignment, Tip Planarity, Guide Plate
•Planarity, Screw Height, PCB components
