Wafer Marco Inspection(MA)
Easy Field Corporation
Wafer Auto Inspection Machine
With multi-angle detection viewing angles, it can replace the human eye to judge defects on the wafer.
Equipped with bright and dark field light sources, which can be switched for different defect types.
Applicable to Silicon & Glass Wafer.
Both the front and back sides of the wafer can be inspected.
Visual Edge Alignment.
